S&C Electric Co., an employee-owned company with global headquarters in Chicago, Illinois, rolled out an innovative solution designed to mitigate nuisance outages for power customers located on the ...

Test Objectives Prior to the primary underground cable and joint fault testing, ComEd established two objectives: • To measure the incident heat energy so accurate parameters, such as arc gap and ...

If your circuit design has requirements to be tolerant to certain faults and to report their occurrence, you’ll need to test the fault detection and protection features of your design during the test ...

The 2002 NEC implemented new requirements to help reduce the number of electrical fires caused by parallel arc faults in branch circuit wiring. All branch circuits supplying bedrooms in single-family ...

The electronics industry is in the midst of a transformation that is drastically changing product design and manufacture. Deep submicron process technology puts more gates on a chip, and the ...

The new BAUR titron test van represents the latest development of a new generation of cable fault location systems. Titron is a fully automatic, centrally controlled, and intelligent system designed ...

EAST AURORA, N.Y.--(BUSINESS WIRE)--Astronics Corporation (NASDAQ:ATRO), a leading provider of advanced technologies for the global aerospace, defense and semiconductor industries, announced today ...

Fault localisation, an essential component of modern software engineering, seeks to identify and isolate faulty portions of code, thereby expediting the debugging process and improving overall system ...

Early results of using device-aware testing on alternative memories show expanded test coverage, but this is just the start. Once the semiconductor industry realized that it was suffering from device ...

Test point selection and fault diagnosis remain critical challenges in the analysis and maintenance of analog systems. As these systems operate with continuous-valued signals and are susceptible to ...

A new technical paper titled “Aging Aware Steepening of the Fault Coverage Curve of a Scan Based Transition Fault Test Set” was published by researchers at Purdue University. “Chip aging may result in ...