Chip testing has become increasingly complex due to the number of variables impacting designs – from design size and complexity, to high transistor counts on advanced technology nodes, to 2.5D/3D ...
This post addresses the specific hurdle of effective and efficient manufacturing tests for these complex devices. It outlines ...
Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...
The latest version of Mentor Graphics' TestKompress compression and ATPG generation tool brings significant enhancements in functionality and productivity. One of the most time-consuming aspects of ...
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